This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware; Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow; Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems; Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both; Includes coverage of resilient aspects of emerging applications such as IoT.
Circadian Rhythms for Future Resilient Electronic Systems Ebook
Accelerated Active Self-Healing for Integrated Circuits
By: Xinfei Guo; Mircea R. Stan
Publisher:
Springer
Print ISBN: 9783030200503, 3030200507
eText ISBN: 9783030200510, 3030200515
Copyright year: 2020
Format: EPUB
Available from $ 159.00 USD
SKU: 9783030200510
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